Published 1997
| Version v1
Miscellaneous
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X-ray electron probe microanalysis of dielectric specimens
- 1. Moscow State Univ., Moscow (Russian Federation)
- 2. Inst. for Technology Problems of Microelectronics and High Pure Materials, MOscow (Russian Federation)
Description
no abstract available
Files
30047861.pdf
Files
(55.4 kB)
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Additional details
Publishing Information
- Imprint Title
- International Congress on Analytical Chemistry. Abstracts. V. 2
- Imprint Pagination
- [434 p.]
- Journal Page Range
- p. L-59
- Report number
- INIS-RU--431(v.2)
Conference
- Title
- International Congress on Analytical Chemistry
- Dates
- 15-21 Jun 1997
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 30047861
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ACCURACY; ELECTRIC CONDUCTIVITY; ELECTRON PROBES; ERRORS; MATRIX MATERIALS; QUANTITATIVE CHEMICAL ANALYSIS; SAMPLE PREPARATION; SENSITIVITY; THERMAL CONDUCTIVITY; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRICAL PROPERTIES; MATERIALS; NONDESTRUCTIVE ANALYSIS; PHYSICAL PROPERTIES; PROBES; THERMODYNAMIC PROPERTIES