Published August 2008 | Version v1
Journal article Metadata-only

An energy stabilized post-column electron energy-loss spectrometer for transmission electron microscopy

Creators

  • 1. Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing, 100084 (China)
  • 2. Cavendish Laboratory, JJ Thomson Avenue, Cambridge, CB3 0HE (United Kingdom)

Description

An energy stabilizing system for electron energy loss spectrometers in a transmission electron microscope (TEM) is described. A wire-based fast response detector is used to position the zero-loss peak. A digital-based real-time processor is used to stabilize the energy-dispersed electron spectrum and simultaneously to acquire a drift corrected electron energy loss spectrum. The performance of the stabilizing system is evaluated.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/126/1/012094

Additional details

Identifiers

DOI
10.1088/1742-6596/126/1/012094;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
126
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
Acronym
EMAG 2007
Dates
3-7 Sep 2007
Place
Glasgow, Scotland (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41036558
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON DETECTION; ELECTRON SPECTRA; ELECTRON SPECTROMETERS; ENERGY LOSSES; ENERGY-LOSS SPECTROSCOPY; PERFORMANCE; REAL TIME SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CHARGED PARTICLE DETECTION; DETECTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; LOSSES; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTION; SPECTRA; SPECTROMETERS; SPECTROSCOPY