Neutron irradiation damage of silicon carbide
- 1. Toshiba Tungaloy Co., Ltd., Kawasaki (Japan)
- 2. Tokyo Inst. of Technology (Japan)
- 3. Tokyo Inst. of Technology, Yokohama (Japan)
Description
Neutron irradiation uniformly produces vacancies and interstitials in silicon carbide (SiC) polycrystals, and the specimen swells by 1 to 3%. Subsequent isochronal annealing leads to annihilation of the defects by the interstitial-vacancy recombination from around irradiation temperature, resulting in the shrinkage of the specimen. This shrinkage can be detected by measuring the specimen length with a conventional micrometer and its lattice parameter with an X-ray diffractometer. Furthermore, defect formation and annihilation affect the electrical resistivity and create paramagnetic centers caused by unpaired electrons. Helium atoms can be uniformly introduced into SiC utilizing the nuclear reaction of 10B(n, α)7Li. By subsequent annealing above nearly 1300 degree C, helium atoms with high vibration energy capture thermal vacancies to reduce the internal pressure and form bubbles at grain boundaries. The formation of helium bubbles accompanies a large volume expansion with increasing temperature, controlled by Greenwood et al.'s mechanism. The presence of helium bubbles at the grain boundaries promotes diffusional creep at lower temperatures (1300 degree C). Changes in physical properties by neutron irradiation are presented and discussed with respect to microstructures. 61 refs., 13 figs
Additional details
Publishing Information
- Journal Title
- Fusion Technology
- Journal Volume
- 27
- Journal Issue
- 3
- Journal Page Range
- p. 314-325.
- ISSN
- 0748-1896
- CODEN
- FUSTE8
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27025338
- Subject category
- S36: MATERIALS SCIENCE; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- DAMAGING NEUTRON FLUENCE; HELIUM; MICROSTRUCTURE; NEUTRON EMISSION; NUCLEAR REACTIONS; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; SHRINKAGE; SILICON CARBIDES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CRYSTAL STRUCTURE; CRYSTALS; ELEMENTS; EMISSION; NEUTRON FLUENCE; NONMETALS; RADIATION EFFECTS; RARE GASES; SILICON COMPOUNDS