Application of the dielectric barrier discharge to detect defects in a teflon coated metal surface
Creators
- 1. Department of Electrical and Computer Engineering, Kumamoto University, Kurokami 2-39-1, Kumamoto 860-8555 (Japan)
- 2. Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga-kouen 6-1, Kasuga, Fukuoka 816-8580 (Japan)
- 3. Sanwa-hitech, Hukutomi 210-29, Kikuchi, Kumamoto 861-1116 (Japan)
- 4. Kumamoto Technopolis Foundation Applied Electronics Research Center, Tabaru 2081-10, Mashiki, Kumamoto 861-2202 (Japan)
Description
In the semiconductor industry, flexible stainless steel tubes, the inside of which are coated with thick Teflon films, by the splay coating method, have been used to prevent their degradation and erosion by organic solvents. We have developed an inspection system to detect pinholes and cracks in the deposited Teflon films, and the dielectric barrier discharge (DBD) was employed to reduce residual substances and damages to the coated film in the tube. Conducting water contained in the cylinder-like glass pipe was used as a liquid electrode to apply a high voltage at any portion of the tube tested. A defective part with a pinhole was modelled by a point electrode in this experiment, because the uncoated defective part has a lower electric breakdown voltage. High frequency voltage (10 kHz) was applied between the point electrode and the liquid electrode. The level of the liquid electrode was varied to detect the occurrence of a microdischarge. It is found that the number of current pulses due to the microdischarge can be used to estimate the size and location of the defective uncoated point of the sample tube
Availability note (English)
Available online at http://stacks.iop.org/0022-3727/36/2883/d3_23_003.pdf or at the Web site for the Journal of Physics. D, Applied Physics (ISSN 1361-6463) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0022-3727/36/2883/d3_23_003.pdf; http://www.iop.org/;
- DOI
- 10.1088/0022-3727/36/23/003;
- PII
- S0022-3727(03)60095-1;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 36
- Journal Issue
- 23
- Journal Page Range
- p. 2883-2886
- ISSN
- 0022-3727
- CODEN
- JPAPBE
Conference
- Title
- 3. international workshop on basic aspects of non-equilibrium plasmas interacting with surfaces
- Acronym
- BANPIS'03
- Dates
- 7-8 Feb 2003
- Place
- Hyogo (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35028552
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRACKS; ELECTRIC DISCHARGES; ELECTRODES; PERFORMANCE TESTING; PROTECTIVE COATINGS; TEFLON; THIN FILMS; TUBES
- Descriptors DEC
- COATINGS; FILMS; FLUORINATED ALIPHATIC HYDROCARBONS; HALOGENATED ALIPHATIC HYDROCARBONS; MATERIALS; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PLASTICS; POLYETHYLENES; POLYMERS; POLYOLEFINS; POLYTETRAFLUOROETHYLENE; SYNTHETIC MATERIALS; TESTING