Published May 2006
| Version v1
Journal article
Line broadening analysis of implosion core conditions at Z using argon K-shell spectroscopy
Creators
- 1. Department of Physics, University of Nevada, Reno, NV 89557 (United States)
- 2. Sandia National Laboratories, Albuquerque, NM 87185 (United States)
- 3. Prism Computational Sciences, Madison, WI 53703 (United States)
Description
We report on spectral line broadening analysis of Ar K-shell lines from argon-doped implosion cores driven by a dynamic hohlraum z-pinch. The observed Ar spectra include emissions from the resonance series in H- and He-like Ar ions, i.e., Lyα, Lyβ and Lyγ, and Heα, Heβ, Heγ and Heδ lines, respectively. The analysis accounts for opacity and Stark broadening to determine electron density, Ne, and areal-density, NΔR, values for the ground state populations of H- and He-like Ar ions. Furthermore, these results are combined with the ratio of H- and He-like ground state populations to extract the electron temperature, Te
Additional details
Identifiers
- DOI
- 10.1016/j.jqsrt.2005.05.009;
- PII
- S0022-4073(05)00138-X;
Publishing Information
- Journal Title
- Journal of Quantitative Spectroscopy and Radiative Transfer
- Journal Volume
- 99
- Journal Issue
- 1-3
- Journal Page Range
- p. 120-130
- ISSN
- 0022-4073
- CODEN
- JQSRAE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37063769
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ARGON; ARGON IONS; DOPED MATERIALS; ELECTRON DENSITY; ELECTRON TEMPERATURE; EMISSION; GROUND STATES; IMPLOSIONS; K SHELL; LINE BROADENING; OPACITY; PLASMA DIAGNOSTICS; RESONANCE; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY LEVELS; FLUIDS; GASES; IONS; MATERIALS; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RARE GASES; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.