Published March 1975
| Version v1
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Nuclear EMP: voltage clamping levels for several TransZorb transient suppression devices
Description
Voltage clamping levels for the 1N5629A, 1N5545A, 1N5654A, and 1N5664A TransZorb/sup T.M./ silicon transient-suppression devices in a DO-13 package are presented as data in photographs of test waveforms. A graph is compiled which illustrates the clamping voltage at a time point of 80 nsec for each of the devices. The duration of the test pulse was 250 nsec with a slope of 4 kV per nsec for the rise portion. Clamping levels are nearly constant for test current amplitudes of up to 120 A
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS.
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The record is publicly accessible, but files are restricted to users with access.
Additional details
Additional titles
- Augmented title (English)
- For EMP protection
Publishing Information
- Imprint Pagination
- 8 p.
- Report number
- PEM--33
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7249484
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTROMAGNETIC PULSES; ELECTRONIC EQUIPMENT; EQUIPMENT PROTECTION DEVICES; PHYSICAL RADIATION EFFECTS; PULSE RISE TIME; RADIATION HARDENING; TRANSIENTS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; HARDENING; RADIATION EFFECTS; RADIATIONS; TIMING PROPERTIES
Optional Information
- Notes
- Available from NTIS. $4.50.