Published August 1985 | Version v1
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Measurement of secondary electron emission coefficient of wall materials using auger electron spectroscopy

  • 1. Japan Atomic Energy Research Inst., Naka, Ibaraki. Naka Fusion Research Establishment

Description

An Auger electron spectroscopy (AES) has been employed to determine the secondary electron emission coefficient of various wall materials. The coefficient of material relates closely to the surface composition which is modified by surface treatments including baking, argon ion etching and methane glow discharge. Based on the results, we took countermeasures to decrease secondary electron emission from the inner wall of the JT-60 RF waveguides. (author)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
27 p.
Report number
JAERI-M--85-123