Published June 17, 1978
| Version v1
Journal article
Thin-film continuity observed by Auger spectroscopy
Description
It is possible to investigate superficial continuity of a thin film by spectroscopical Auger techniques. The first experimental results, obtained with materials largerly used in thin films technology (gold and copper) are reported. Copper is able to form superficial continuous films down to a thickness of 40 A; a mean thickness of 65 A of gold is not sufficient to guarantes a continuous film growth
Additional details
Publishing Information
- Journal Title
- Lett. Nuovo Cim.
- Journal Volume
- 22
- Journal Issue
- 7
- Series
- Lett. Nuovo Cim.
- Journal Page Range
- 277-280
INIS
- Country of Publication
- Italy
- Country of Input or Organization
- Italy
- INIS RN
- 10434439
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; COPPER; FILMS; GOLD; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; SPECTROSCOPY; TRANSITION ELEMENTS