Published June 17, 1978 | Version v1
Journal article

Thin-film continuity observed by Auger spectroscopy

  • 1. Universita di Calabria, Cosenza (Italy)

Description

It is possible to investigate superficial continuity of a thin film by spectroscopical Auger techniques. The first experimental results, obtained with materials largerly used in thin films technology (gold and copper) are reported. Copper is able to form superficial continuous films down to a thickness of 40 A; a mean thickness of 65 A of gold is not sufficient to guarantes a continuous film growth

Additional details

Publishing Information

Journal Title
Lett. Nuovo Cim.
Journal Volume
22
Journal Issue
7
Series
Lett. Nuovo Cim.
Journal Page Range
277-280

INIS

Country of Publication
Italy
Country of Input or Organization
Italy
INIS RN
10434439
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; COPPER; FILMS; GOLD; THICKNESS
Descriptors DEC
DIMENSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; SPECTROSCOPY; TRANSITION ELEMENTS