Published March 2019 | Version v1
Journal article

Modeling of 180° magnetization switching and clock sensitivity in a tilted multiferroic nanomagnet

  • 1. Department of Basic Sciences, Air Force Engineering University, Xi'an 710051 (China)
  • 2. Department of Electronic Engineering, Dalian Neusoft University of Information, Dalian 116023 (China)

Description

In this paper, the dynamic magnetization model of multiferroic elliptical nanomagnets with different tilt angles is established. Simulation of dynamic magnetization is performed through micromagnetic method. The results show that the clock sensitivities are different for nanomagnets with different tilt angles. For tilt angles below 9°, the larger the tilt angle is, the smaller the stress required for the nanomagnet to flip to the "Null" state is. Encouragingly, 180° switching of tilted nanomagnet can be achieved by applying a bias magnetic field together with stress, even if the nanomagnet is at a high aspect ratio (2:1). However, nanomagnet with excessively large tilt angle (>10°) tends to yield a vortex process during switching. As a consequence, stress duration will be longer, and larger bias magnetic field will be required for 180° switching. Therefore, nanomagnets inclined more than 10° should be avoided in magnetic design. These findings can provide important guidance for the design of multiferroic nanomagnetic logic as well as memory storage.

Additional details

Identifiers

DOI
10.1016/j.jmmm.2018.10.114;
PII
S0304885318325708;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
474
Journal Page Range
p. 161-166
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55023355
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ASPECT RATIO; COMPUTERIZED SIMULATION; DESIGN; MAGNETIC FIELDS; MAGNETIZATION; STRESSES; VORTICES
Descriptors DEC
DIMENSIONLESS NUMBERS; SIMULATION

Optional Information

Copyright
Copyright (c) 2018 Elsevier B.V. All rights reserved.