Published November 2001
| Version v1
Miscellaneous
Physical properties of metal (Ti, Ni)/4H-SiC system by using soft X-ray fluorescence spectroscopy
Creators
- 1. Okayama Univ., Faculty of Science, Okayama (Japan)
- 2. Okayama Univ., Graduate School of Natural Science and Technology, Okayama (Japan)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Activity report of Synchrotron Radiation Laboratory 2000
- Imprint Pagination
- 126 p.
- Journal Page Range
- p. 98-99
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39099944
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Non-conventional Literature, No Abstract
- Descriptors DEI
- ANNEALING; CHEMICAL REACTIONS; EMISSION SPECTRA; KEK PHOTON FACTORY; METALS; NICKEL; NICKEL SILICIDES; PHYSICAL PROPERTIES; SILICON CARBIDES; SOFT X RADIATION; SURFACE PROPERTIES; SYNCHROTRON RADIATION; THIN FILMS; TITANIUM; TITANIUM CARBIDES; TITANIUM SILICIDES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CARBIDES; CARBON COMPOUNDS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; HEAT TREATMENTS; IONIZING RADIATIONS; METALS; NICKEL COMPOUNDS; NONDESTRUCTIVE ANALYSIS; RADIATION SOURCES; RADIATIONS; SILICIDES; SILICON COMPOUNDS; SPECTRA; SYNCHROTRON RADIATION SOURCES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 3 refs., 2 figs.