Positronium time of flight spectrum from NEG surface obtained by high-intensity slow-positron beam
Creators
- 1. High Energy Accelerator Research Organization, Tsukuba, Ibaraki (Japan)
Description
A new slow positron beamline based on a dedicated linac is described. A positron beam is a useful probe for investigating the electronic states in solids, especially concerning the surface phenomena. However, such studies as low-energy positron diffraction, positronium spectroscopy and positron microscopy, which require high intensity slow-positron beams, are very limited due to the poor intensity normally obtained from a conventional radioactive-isotope-based positron source, compared with electron source. We started slow-positron beam experiments with linac based high intensity beam last year. The pulsed beam is used for positronium time-of-flight (Ps-TOF) spectroscopy. This method is applied for a study of non-evaporable getters (NEG). Positronium emission from the surface is obtained. Different process is found when the injection energy of the positron beam increase. (author)
Additional details
Publishing Information
- Publisher
- Particle Accelerator Society of Japan
- Imprint Place
- Tokyo (Japan)
- Imprint Title
- Proceedings of the 1st annual meeting of Particle Accelerator Society of Japan and the 29th Linear Accelerator Meeting in Japan
- Imprint Pagination
- 717 p.
- Journal Page Range
- p. 399-401
Conference
- Title
- 1. annual meeting of Particle Accelerator Society of Japan; 29. Linear Accelerator Meeting in Japan
- Dates
- 4-6 Aug 2004
- Place
- Funabashi, Chiba (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36037573
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM TRANSPORT; KEK LINAC; MATERIALS TESTING; POSITRON BEAMS; POSITRON SOURCES; POSITRONIUM; SURFACE PROPERTIES; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- ACCELERATORS; BEAMS; LEPTON BEAMS; LINEAR ACCELERATORS; MEASURING INSTRUMENTS; PARTICLE BEAMS; PARTICLE SOURCES; RADIATION SOURCES; SPECTROMETERS; TESTING
Optional Information
- Notes
- 2 refs., 3 figs.