Time-resolved x-ray scattering studies using CCD detectors
- 1. Michigan Univ., Ann Arbor, MI (United States). Dept. of Physics
- 2. AT and T Bell Labs., Murray Hill, NJ (United States)
- 3. Argonne National Lab., IL (United States). Advanced Photon Source Div.
Description
The advent of extremely bright x-ray beams from new low emittance sources such as ESRF and APS offers new opportunities for materials research. One of the most exciting and technologically demanding areas is likely to be time-resolved x-ray studies. The authors' recent experiments at NSLS Brookhaven (Beamline X-16B) explore some of the challenges for time-resolved x-ray scattering combining developments in x-ray optics (dispersive geometry), area detectors (CCD's) and fast data acquisition. In this paper the techniques are illustrated with results on the rapid thermal annealing of electronic materials including strained-layer InxCa1-xAs quantum-well structures. The authors described the application of a new virtual-phase CCD detector for real-time diffraction studies at the microsecond time scale
Additional details
Publishing Information
- Publisher
- SPIE Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-0406-3
- Imprint Title
- Advanced x-ray/EUV radiation sources and applications
- Imprint Pagination
- 292 p.
- Journal Page Range
- p. 101-115.
Conference
- Title
- 34. Society of Photo-Optical Instrumentation Engineers (SPIE) annual international technical symposium on optical and optoelectronic applied science and engineering.
- Dates
- 8-13 Jul 1990.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23049361
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S07: ISOTOPES AND RADIATION SOURCES; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- BEAM OPTICS; CHARGE-COUPLED DEVICES; DATA ACQUISITION; EXPERIMENTAL DATA; GALLIUM ARSENIDES; INDIUM ARSENIDES; NSLS; TIME RESOLUTION; X-RAY DIFFRACTION; X-RAY SOURCES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; DATA; DIFFRACTION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; INFORMATION; NUMERICAL DATA; PNICTIDES; RADIATION SOURCES; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES; SYNCHROTRON RADIATION SOURCES; TIMING PROPERTIES
Optional Information
- Secondary number(s)
- CONF-900756--.