Published July 2010 | Version v1
Journal article

Thermal stability of nanocrystalline Pd81Zr19

  • 1. Room 3000, Department of Materials Science and Engineering, North Carolina State University, 911 Partners Way, Raleigh, NC 27695-7907 (United States)
  • 2. Battelle, RDRL-WMM-B, Aberdeen Proving Ground, MD 21005-5069 (United States)
  • 3. Booz Allen Hamilton, RDRL-WMM-B, Aberdeen Proving Ground, MD 21005-5069 (United States)

Description

Grain growth stability in mechanically alloyed nanocrystalline Pd81Zr19 was investigated. Previous research suggested that the alloy is thermodynamically stable to very high temperatures. When X-ray diffraction (XRD) is used to estimate the grain size of annealed samples the alloy appears to have remarkable resistance to growth. Microscopy done here on the same alloy indicated that the XRD estimates are not accurate for samples annealed above 600 deg. C. It appears that when this alloy is annealed at high temperatures XRD peak broadening is retained for reasons that are unrelated to the grain size. The alloy still has much improved grain growth stability compared with pure Pd, but not as significant as suggested by the XRD results. A similar phenomenon was observed in Fe-Zr alloys.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2010.04.023

Additional details

Identifiers

DOI
10.1016/j.actamat.2010.04.023;
PII
S1359-6454(10)00239-9;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
58
Journal Issue
12
Journal Page Range
p. 4292-4297
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43039301
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; ANNEALING; CRYSTALS; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE; MATERIALS; MICROSCOPY; NANOSTRUCTURES; PEAKS; SEGREGATION; SOLUTES; STABILITY; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; HEAT TREATMENTS; MICROSTRUCTURE; SCATTERING; SIZE; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.