Thermal stability of nanocrystalline Pd81Zr19
Creators
- 1. Room 3000, Department of Materials Science and Engineering, North Carolina State University, 911 Partners Way, Raleigh, NC 27695-7907 (United States)
- 2. Battelle, RDRL-WMM-B, Aberdeen Proving Ground, MD 21005-5069 (United States)
- 3. Booz Allen Hamilton, RDRL-WMM-B, Aberdeen Proving Ground, MD 21005-5069 (United States)
Description
Grain growth stability in mechanically alloyed nanocrystalline Pd81Zr19 was investigated. Previous research suggested that the alloy is thermodynamically stable to very high temperatures. When X-ray diffraction (XRD) is used to estimate the grain size of annealed samples the alloy appears to have remarkable resistance to growth. Microscopy done here on the same alloy indicated that the XRD estimates are not accurate for samples annealed above 600 deg. C. It appears that when this alloy is annealed at high temperatures XRD peak broadening is retained for reasons that are unrelated to the grain size. The alloy still has much improved grain growth stability compared with pure Pd, but not as significant as suggested by the XRD results. A similar phenomenon was observed in Fe-Zr alloys.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2010.04.023Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2010.04.023;
- PII
- S1359-6454(10)00239-9;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 58
- Journal Issue
- 12
- Journal Page Range
- p. 4292-4297
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43039301
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; ANNEALING; CRYSTALS; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE; MATERIALS; MICROSCOPY; NANOSTRUCTURES; PEAKS; SEGREGATION; SOLUTES; STABILITY; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; HEAT TREATMENTS; MICROSTRUCTURE; SCATTERING; SIZE; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.