Published August 2009 | Version v1
Journal article Metadata-only

Electron microscopy for Engineers

Creators

  • 1. School of Metallurgy and Materials, University of Birmingham B15 2TT UK (United Kingdom)

Description

This paper reviews the application of (mainly) Transmission Electron Microscopy (TEM) in an engineering context. The first two sections are TEM and chemical in nature; the final three sections are more general and include aspects of Scanning Electron Microscopy (SEM).

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/4/1/012001

Additional details

Identifiers

DOI
10.1088/1757-899X/4/1/012001;

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
4
Journal Issue
1
Journal Page Range
[10 p.]
ISSN
1757-899X

Conference

Title
Workshop on processing, microstructure and performance of materials
Dates
8-9 Apr 2009
Place
Auckland (New Zealand)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43014979
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENGINEERING; ENGINEERS; REVIEWS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
DOCUMENT TYPES; ELECTRON MICROSCOPY; MICROSCOPY; PERSONNEL