Density scaling on n = 1 error field penetration in ohmically heated discharges in EAST
Creators
- 1. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 (China)
- 2. General Atomics, San Diego, CA 92186 (United States)
- 3. School of Physics, Dalian University of Technology, Dalian 116024 (China)
Description
Density scaling of error field penetration in EAST is investigated with different n = 1 magnetic perturbation coil configurations in ohmically heated discharges. The density scalings of error field penetration thresholds under two magnetic perturbation spectra are and , where b r is the error field and n e is the line averaged electron density. One difficulty in understanding the density scaling is that key parameters other than density in determining the field penetration process may also be changed when the plasma density changes. Therefore, they should be determined from experiments. The estimated theoretical analysis ( in lower density region and in higher density region), using the density dependence of viscosity diffusion time, electron temperature and mode frequency measured from the experiments, is consistent with the observed scaling. One of the key points to reproduce the observed scaling in EAST is that the viscosity diffusion time estimated from energy confinement time is almost constant. It means that the plasma confinement lies in saturation ohmic confinement regime rather than the linear Neo-Alcator regime causing weak density dependence in the previous theoretical studies. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1741-4326/aab5c0Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Fusion
- Journal Volume
- 58
- Journal Issue
- 5
- Journal Page Range
- [8 p.]
- ISSN
- 0029-5515
- CODEN
- NUFUAU
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51089415
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CONFINEMENT TIME; ELECTRON DENSITY; ELECTRON TEMPERATURE; ERRORS; PERTURBATION THEORY; PLASMA CONFINEMENT; PLASMA DENSITY; SCALING
- Descriptors DEC
- CONFINEMENT
Optional Information
- Collaborations
- EAST Contributors