The x-ray reflection efficiencies of planes (III) in germanium silicon and fluorite analyzing crystals. Experimental data

Integrated and peak reflection efficiency curves relative to a LiF crystal are presented. Kα fluorescent radiations between (22) Ti and (41) Nb were used for both germanium and silicon crystals: the interval was extended to CaKα radiation in the short wavelength region with the fluorite crystal. Reflection efficiency curves show sharp declines in the region around the K absorption edges of germanium and calcium. For CuKα radiation, the experimental reflection efficiencies at the peak for germanium, silicon and fluorite crystals are 52, 38.5 and 17 percent, whereas the integrated reflection efficiencies are 65.5, 38 and 14 percent respectively. The data were obtained from untreated crystals, using a standard Norelco non-focussing X-ray spectrometer. Experimental procedures are presented. Some considerations about the (222) missing reflections are made. (Author) 12 refs