Published 2002 | Version v1
Miscellaneous Open

Correlation between crystalline structure and electrical properties on PbS thin films

Creators

  • 1. Posgrado en Optoelectronica, FCFM, BUAP Puebla (Mexico)
  • 2. Facultad de Ciencias Quimicas, BUAP, Puebla (Mexico)
  • 3. Depto. de Fisica, Centro de Investigacion y de Estudios Avanzados del IPN (Mexico)
  • 4. Instituto de Investigacion en Materiales, UNAM, Mexico D.F. (Mexico)
  • 5. Facultad de Ciencias de la Electronica, BUAP, Puebla (Mexico)

Description

no abstract available

Availability note (English)

Available from INIS in electronic form

Files

33066719.pdf

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Additional details

Publishing Information

Imprint Pagination
2 p.
Report number
INIS-MX--1075

Conference

Title
International Materials Research Congress Cancun 2002
Dates
25-29 Aug 2002
Place
Cancun (Mexico)

INIS

Country of Publication
Mexico
Country of Input or Organization
Mexico
INIS RN
33066719
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DENSITY; ELECTRICAL PROPERTIES; GRAIN SIZE; LEAD SULFIDES; SPECTROSCOPY; TEMPERATURE DEPENDENCE; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; FILMS; LEAD COMPOUNDS; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SIZE; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING