Published 1974
| Version v1
Journal article
Employment of novel semiconductor components for radiation measurement in analytical measuring techniques
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Einsatz neuerer Halbleiterbauelemente zur Strahlungsmessung in der Analysenmesstechnik
Publishing Information
- Journal Title
- Arch. Tech. Mess. Messtech. Prax.
- Journal Volume
- 463
- Journal Issue
- 8
- Series
- Arch. Tech. Mess. Messtech. Prax.
- Journal Page Range
- 124-129
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 6202005
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHEMICAL ANALYSIS; ELECTRONIC EQUIPMENT; ENERGY RESOLUTION; GAMMA DETECTION; LI-DRIFTED SI DETECTORS; SENSITIVITY; X-RAY DETECTION
- Descriptors DEC
- LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- 11 figs.; 6 refs.