The determination, by x-ray fluorescence analysis, of platinum, palladium, ruthenium, iron, and chromium in special steels
- 1. Council for Mineral Technology, Randburg (South Africa). Analytical Science Div.
Description
This report describes the analysis of special corrosion-resistant steels for ruthenium, palladium, and platinum by X-ray-fluorescence spectrometry (XRFS) and a thin-film technique. The precision of this method varies from 1 to 7 per cent, depending upon the analyte and its concentrations. The accuracy is good and compares favourably with that of other methods. The direct determination of these elements on solid samples with the use of scattered radiation as a matrix correction is only partly successful and is not recommended. The three platinum-group elements, iron, and chromium can be determined successfully in solid samples by XRFS if an empirical interelement correction method is used. The correction factors are determined by a multiple-regression method. The precision of the determination of the platinum-group elements is about 1 per cent and that of iron and chromium about 0,2 per cent. The accuracy is in most cases better than 2 per cent for all the elements determined. The method can be implemented with the use of available computer software and a small microcomputer. The two recommended laboratory methods are given as appendices to the report
Availability note (English)
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Additional details
Publishing Information
- ISBN
- 0 86999 761 0
- Imprint Pagination
- 28 p.
- Report number
- MINTEK-M--269
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 18026299
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ABSORPTION; ACCURACY; CHROMIUM; COMPUTER CODES; EXPERIMENTAL DATA; FREQUENCY RANGE; IRON; MATRICES; PALLADIUM; PLATINUM; REGRESSION ANALYSIS; RUTHENIUM; SCATTERING; SCINTILLATION COUNTERS; SPECTROSCOPY; STEELS; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHEMICAL ANALYSIS; DATA; ELEMENTS; FILMS; INFORMATION; IRON ALLOYS; IRON BASE ALLOYS; MATHEMATICS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; PLATINUM METALS; RADIATION DETECTORS; SPECTROMETERS; STATISTICS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS