X-ray inelastic scattering under conditions of asymmetric Bragg diffraction

The measurements of the curve of the Compton and thermal diffusion scatterings yield in the symmetic Bragg diffraction scheme from (220) - Si crystal reflection using CuKα-radiation are given. On the obtained energy spectrum of escaping X-rays the peak of fluorescent radiation and the peak of Compton and thermal diffusion scatterings are marked out. In transition to assymetric case of diffraction a strong effect of amplification of Compton radiation yield is observed which opens the principally new possibilities in investigation of electronic structure of solids