Published February 29, 2012 | Version v1
Journal article

Mechanical properties of H2Pc self-assembled monolayers at the single molecule level by noncontact atomic force microscopy

  • 1. State Key Lab of Low-Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing 100084 (China)

Description

The mechanical properties of molecular self-assembled monolayers (SAMs) play an important role in understanding the interactions between molecules in the self-assembly, the interactions between molecules and substrate, and thus the formation mechanism of SAMs. Using a high-resolution noncontact atomic force microscope (NC-AFM) combined with a scanning tunneling microscope (STM), we have successfully obtained the sub-molecular resolution of a H2Pc self-assembled monolayer grown on a Pb(111) surface. A 2 × 2 superstructure was observed in both AFM and STM topographic images. The lateral critical force of removing a H2Pcmolecule from its SAM and moving a single H2Pc molecule on Pb(111) were measured. An oscillation of the critical force along the edge of the H2Pc SAM with a period of two molecular sites was observed, which can be attributed to the 2 × 2 superstructure. The lateral critical force caused by intermolecular interaction was found to be 25 pN on average and is typically two times larger than the molecule-substrate interaction. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/24/8/084004

Additional details

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
24
Journal Issue
8
Journal Page Range
[6 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43100998
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; HYDROGEN COMPOUNDS; INTERACTIONS; LEAD; MECHANICAL PROPERTIES; MOLECULES; OSCILLATIONS; RESOLUTION; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACES
Descriptors DEC
ELEMENTS; METALS; MICROSCOPY