Published August 20, 1998 | Version v1
Journal article

Surface charging of insulated materials by negative ion beam bombardment

  • 1. Department of Electronic Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-01 (Japan)

Description

When a negative ion beam bombards an insulated material such as an isolated electrode or an insulator, a surface voltage is induced by the surface charging and will affect the ion beam trajectories during beam transport. The mechanism of the surface charging of an insulated electrode is related with its secondary electron emission factor and energy distribution. The charging voltage in this case is as low as several volts and its polarity is positive. On the other hand, in case of an insulator, the polarity is negative and its value is several volts because an electric dipole layer is generated just on the surface due to negative ion beam bombardment. These low surface charging voltages lead an advantage in negative ion beam applications as well as in negative ion beam transport

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
439
Journal Issue
1
Journal Page Range
p. 217-220
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international symposium on the production and neutralization of negative ions and beams; 7. european workshop on the production and application of light negative ions
Dates
14-19 Sep 1997
Place
Villagium of Giens (France)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40069199
Subject category
S43: PARTICLE ACCELERATORS; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANIONS; BEAM TRANSPORT; CHARGE DISTRIBUTION; DIELECTRIC MATERIALS; ELECTRIC DIPOLES; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON EMISSION; ENERGY SPECTRA; ION BEAMS; LAYERS; SURFACES
Descriptors DEC
BEAMS; CHARGED PARTICLES; DIPOLES; EMISSION; IONS; MATERIALS; MULTIPOLES; SPECTRA

Optional Information

Notes
(c) 1998 American Institute of Physics.