Surface charging of insulated materials by negative ion beam bombardment
- 1. Department of Electronic Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-01 (Japan)
Description
When a negative ion beam bombards an insulated material such as an isolated electrode or an insulator, a surface voltage is induced by the surface charging and will affect the ion beam trajectories during beam transport. The mechanism of the surface charging of an insulated electrode is related with its secondary electron emission factor and energy distribution. The charging voltage in this case is as low as several volts and its polarity is positive. On the other hand, in case of an insulator, the polarity is negative and its value is several volts because an electric dipole layer is generated just on the surface due to negative ion beam bombardment. These low surface charging voltages lead an advantage in negative ion beam applications as well as in negative ion beam transport
Additional details
Identifiers
- DOI
- 10.1063/1.56351;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 439
- Journal Issue
- 1
- Journal Page Range
- p. 217-220
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. international symposium on the production and neutralization of negative ions and beams; 7. european workshop on the production and application of light negative ions
- Dates
- 14-19 Sep 1997
- Place
- Villagium of Giens (France)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40069199
- Subject category
- S43: PARTICLE ACCELERATORS; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANIONS; BEAM TRANSPORT; CHARGE DISTRIBUTION; DIELECTRIC MATERIALS; ELECTRIC DIPOLES; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON EMISSION; ENERGY SPECTRA; ION BEAMS; LAYERS; SURFACES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; DIPOLES; EMISSION; IONS; MATERIALS; MULTIPOLES; SPECTRA
Optional Information
- Notes
- (c) 1998 American Institute of Physics.