Published June 5, 1981 | Version v1
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Low energy x-ray spectrometer

Description

A subkilovolt spectrometer has been produced to permit high-energy-resolution, time-dependent x-ray intensity measurements. The diffracting element is a curved mica (d = 9.95A) crystal. To preclude higher order (n > 1) diffractions, a carbon x-ray mirror that reflects only photons with energies less than approx. 1.1 keV is utilized ahead of the diffracting element. The nominal energy range of interest is 800 to 900 eV. The diffracted photons are detected by a gold-surface photoelectric diode designed to have a very good frequency response, and whose current is recorded on an oscilloscope. A thin, aluminium light barrier is placed between the diffracting crystal and the photoelectric diode detector to keep any uv generated on or scattered by the crystal from illuminating the detector. High spectral energy resolution is provided by many photocathodes between 8- and 50-eV wide placed serially along the diffracted x-ray beam at the detector position. The spectrometer was calibrated for energy and energy dispersion using the Ni Lα12 lines produced in the LLNL IONAC accelerator and in third order using a molybdenum target x-ray tube. For the latter calibration the carbon mirror was replaced by one surfaced with rhodium to raise the cut-off energy to about 3 keV. The carbon mirror reflection dependence on energy was measured using one of our Henke x-ray sources. The curved mica crystal diffraction efficiency was measured on our Low-Energy x-ray (LEX) machine. The spectrometer performs well although some changes in the way the x-ray mirror is held are desirable. 16 figures

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

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Additional details

Publishing Information

Imprint Pagination
6 p.
Report number
UCRL--85684

Conference

Title
1981 topical conference on low-energy X-ray diagnostics.
Dates
8 - 10 Jun 1981.
Place
Livermore, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
12639174
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
MIRRORS; X-RAY DIFFRACTION; X-RAY SPECTROMETERS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MEASURING INSTRUMENTS; SCATTERING; SPECTROMETERS

Optional Information

Secondary number(s)
CONF-810651--3.