Low energy x-ray spectrometer
Description
A subkilovolt spectrometer has been produced to permit high-energy-resolution, time-dependent x-ray intensity measurements. The diffracting element is a curved mica (d = 9.95A) crystal. To preclude higher order (n > 1) diffractions, a carbon x-ray mirror that reflects only photons with energies less than approx. 1.1 keV is utilized ahead of the diffracting element. The nominal energy range of interest is 800 to 900 eV. The diffracted photons are detected by a gold-surface photoelectric diode designed to have a very good frequency response, and whose current is recorded on an oscilloscope. A thin, aluminium light barrier is placed between the diffracting crystal and the photoelectric diode detector to keep any uv generated on or scattered by the crystal from illuminating the detector. High spectral energy resolution is provided by many photocathodes between 8- and 50-eV wide placed serially along the diffracted x-ray beam at the detector position. The spectrometer was calibrated for energy and energy dispersion using the Ni Lα12 lines produced in the LLNL IONAC accelerator and in third order using a molybdenum target x-ray tube. For the latter calibration the carbon mirror was replaced by one surfaced with rhodium to raise the cut-off energy to about 3 keV. The carbon mirror reflection dependence on energy was measured using one of our Henke x-ray sources. The curved mica crystal diffraction efficiency was measured on our Low-Energy x-ray (LEX) machine. The spectrometer performs well although some changes in the way the x-ray mirror is held are desirable. 16 figures
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.
Files
Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- UCRL--85684
Conference
- Title
- 1981 topical conference on low-energy X-ray diagnostics.
- Dates
- 8 - 10 Jun 1981.
- Place
- Livermore, CA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12639174
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- MIRRORS; X-RAY DIFFRACTION; X-RAY SPECTROMETERS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MEASURING INSTRUMENTS; SCATTERING; SPECTROMETERS
Optional Information
- Secondary number(s)
- CONF-810651--3.