Microstructures and tribological properties of CrN/ZrN nanoscale multilayer coatings
- 1. LERMPS, Universite de Technologie de Belfort-Montbeliard (UTBM), Site de Montbeliard, F-90010 Belfort Cedex (France)
- 2. State Key Laboratory of Materials Modification, Dalian University of Technology, Dalian 116024 (China)
Description
Nanoscale multilayer CrN/ZrN coatings with bilayer thicknesses ranging from 11.7 to 66.7 nm were prepared by reactive magnetron sputtering techniques. The structure of the thin films was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). X-ray diffraction results showed that CrN individual layers presented a <1 1 1> preferred orientation in the multilayer coatings. The diffraction peaks of CrN shifted continuously to low diffraction angle with decreasing bilayer thickness. TEM observations showed that the multilayer did not form a superlattice structure instead of the coexistence of nanocrystalline CrN and ZrN layers. Columnar growth for all the coatings was observed by cross-sectional SEM. Nanoindentation tests showed that the multilayer coatings had almost a constant nanohardness of 29 GPa in spite of the variations of bilayer thickness. Pin-on-disk tests indicated that both the friction coefficients and wear rates increased when decreasing bilayer thickness. However, in comparison with the monolayer coating, the multilayer coatings exhibited excellent wear resistance.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.10.075Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.10.075;
- PII
- S0169-4332(08)02242-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 7
- Journal Page Range
- p. 4020-4026
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009331
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM NITRIDES; COATINGS; COMPARATIVE EVALUATIONS; FRICTION FACTOR; GRAIN ORIENTATION; HARDNESS; LAYERS; MAGNETRONS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TRIBOLOGY; WEAR RESISTANCE; X-RAY DIFFRACTION; ZIRCONIUM NITRIDES
- Descriptors DEC
- CHROMIUM COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; FILMS; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITRIDES; NITROGEN COMPOUNDS; ORIENTATION; PNICTIDES; SCATTERING; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.