Published April 1, 1982
| Version v1
Journal article
General instrumentation considerations in electron and ion spectroscopies using synchrotron radiation
Description
Instruments used so far for electron and ion spectroscopies using synchrotron radiation span the spectrum from the audaciously simple to the highly sophisticated. Current practice is surveyed, and an attempt is made to discern future directions. The various multidetection modes are discussed. The distinction between general-purpose and special-purpose instruments is emphasized, and the design of an instrument intended specifically for high k-space resolution is outlined. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 195
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 309-321
- ISSN
- 0029-554X
Conference
- Title
- 2. national conference on synchrotron radiation instrumentation.
- Dates
- 15 - 17 Jul 1981.
- Place
- Ithaca, NY, USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 13700428
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ANGULAR DISTRIBUTION; COMPILED DATA; ELECTRON DIFFRACTION; ELECTRON SPECTROSCOPY; ENERGY RESOLUTION; EXPERIMENTAL DATA; FAR ULTRAVIOLET RADIATION; ION SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTOIONIZATION; POLARIZATION; SPATIAL RESOLUTION; SPIN ORIENTATION; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; DATA; DIFFRACTION; DISTRIBUTION; ELECTROMAGNETIC RADIATION; EMISSION; INFORMATION; IONIZATION; NUMERICAL DATA; ORIENTATION; RADIATIONS; RESOLUTION; SCATTERING; SECONDARY EMISSION; SPECTROSCOPY; ULTRAVIOLET RADIATION