Published September 30, 2013
| Version v1
Journal article
Strain relaxation in epitaxial SrRuO3 thin films on LaAlO3 substrates
Creators
- 1. State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054 (China)
- 2. Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, USA and Department of Physics and The Texas Center for Superconductivity, University of Houston, Houston, Texas 77204 (United States)
Description
Strain relaxation behavior of epitaxial SrRuO3 thin films on (001) LaAlO3 substrates was investigated using high resolution X-ray diffraction. Lattice distortion and dislocation densities were systematically studied with samples under different growth conditions. Reciprocal space maps reveal different strain relaxation behavior in SrRuO3 thin films grown at different temperatures. Two kinds of strain relaxation mechanisms were proposed to understand the growth dynamics, including the evolution of threading dislocations and the tilt of crystalline planes
Additional details
Identifiers
- DOI
- 10.1063/1.4823593;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 103
- Journal Issue
- 14
- Journal Page Range
- p. 141901-141901.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45038905
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; DENSITY; DISLOCATIONS; EPITAXY; LANTHANUM COMPOUNDS; LAYERS; MAPS; RELAXATION; RESOLUTION; RUTHENIUM COMPOUNDS; SPACE; STRAINS; STRONTIUM COMPOUNDS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; DIFFRACTION; FILMS; LINE DEFECTS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC