Published May 1, 1996
| Version v1
Journal article
A life time test of neutron irradiated light emitting diodes
- 1. Bern Univ. (Switzerland). Lab. for High Energy Phys.
- 2. Department of Nuclear Physics, Oxford University, Oxford (United Kingdom)
Description
The results of an accelerated life time test of neutron irradiated ABB Hafo radiation hard LEDs are presented. After a 1 MeV neutron irradiation with up to 1.4 .1014 n/cm2 at the Rutherford Appleton Lab (RAL) ISIS facility, the LEDs have been operated without seeing any degradation due to ageing for a time which is estimated to correspond to about 57 years of operation in the ATLAS SemiConductor Tracker (SCT) at the Large Hadron Collider (LHC). The irradiation decreased the light output of the LEDs substantially, but during the operation of the LEDs a fast annealing of most of the irradiation damage was observed. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 373
- Journal Issue
- 3
- Journal Page Range
- p. 320-324.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27054230
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AGING; ANNEALING; LEP STORAGE RINGS; LIGHT EMITTING DIODES; MEV RANGE 01-10; NEUTRON BEAMS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; STABILITY; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ACCELERATORS; BEAMS; CYCLIC ACCELERATORS; ENERGY RANGE; HEAT TREATMENTS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; STORAGE RINGS; SYNCHROTRONS; TEMPERATURE RANGE