Australis: Progress Report
Creators
- 1. Commonwealth Scientific and Industrial Research Organisation (CSIRO), North Ryde, NSW (Australia). Div. of Exploration Geoscience
Description
The first stage of the development of AUSTRALIS, a microbeam AMS system at the HIGF laboratory at North Ryde, Sydney has been completed. The system is designed to enable in-situ microanalysis of geological samples for ultra-traces and for isotopic data for minerals exploration research. The negative ions for analysis are produced by sputtering with a microbeam of Cs+from a modified General Ionex model 834 HICONEX ion source. The source features a novel intermediate or 'screen' electrode to correct for the effect of the secondary ion extraction field on the trajectory of the primary beam,in order to bring the primary beam to the geometric centre. The high energy analysis system of AUSTRALIS features a pair of deflector systems to permit fast switching of isotopes without altering the magnet setting. The paper describes the initial tests' results showing good agreement with the design parameters. 5 refs., 4 figs
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28056338.pdf
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Additional details
Publishing Information
- Imprint Place
- Lucas Heights (Australia)
- Imprint Title
- 9th Australian conference on nuclear techniques of analysis. Proceedings
- Imprint Pagination
- 186 p.
- Journal Page Range
- p. 56-58.
- Report number
- INIS-AU--0003
Conference
- Title
- 9. Australian conference on nuclear techniques of analysis.
- Dates
- 27-29 Nov 1995.
- Place
- Newcastle, NSW (Australia).
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 28056338
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- BEAM OPTICS; CESIUM IONS; EXPERIMENTAL DATA; ION SOURCES; ISOTOPE RATIO; MASS SPECTROMETERS; MASS SPECTROSCOPY; MICROANALYSIS; PROTON BEAMS; PROTON MICROPROBE ANALYSIS; SECONDARY EMISSION; SPUTTERING; TRACE AMOUNTS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; DATA; EMISSION; INFORMATION; IONS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; NUMERICAL DATA; PARTICLE BEAMS; SPECTROMETERS; SPECTROSCOPY