Employing poly(4-vinylpyridine) as the dielectrics for enhanced molybdenum disulfide field-effect transistors
- 1. College of Science, Shanghai Institute of Technology, Shanghai, 201418 (China)
- 2. Organic Optoelectronics Engineering Research Center of Fujian's Universities, College of Electronics and Information Science, Fujian Jiangxia University, Fuzhou, 350108 (China)
Description
Herein, field-effect transistors (FET) based on multilayer molybdenum disulfide (MoS) nanoflakes are fabricated by employing poly(4-vinylpyridine) (PVP) as the modified layer of typical inorganic dielectric (SiO). The MoS nanoflakes are directly exfoliated from bulk MoS and transferred onto the PVP surface instead of bare SiO substrate that renders the enlarged nanoflake size. Taking advantage of the high surface energy and low surface roughness of PVP surface, the enhanced interaction between PVP and MoS bulk crystal may be achieved that is responsible for the large-size MoS nanoflakes (≈2.5 × 10 µm). Importantly, MoS FETs based on the double-gate insulators consisting of PVP and SiO exhibit improved device performances. The on-state current presents a fivefold increase and the field-effect mobility is improved from 4.75 to 167.79 cm Vs, which are attributed to the PVP surface with low charge-trap states and the lowered Schottky Barrier height (Φ). The current studies will effectively push the applications of MoS nanoflakes in flexible electronics. (© 2022 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202100795Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 219
- Journal Issue
- 16
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 53102563
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CAPACITANCE; CARRIER MOBILITY; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; FIELD EFFECT TRANSISTORS; MOLYBDENUM SULFIDES; NANOSTRUCTURES; PERFORMANCE; POLYVINYLS; PYRIDINES; RAMAN SPECTRA; ROUGHNESS; SILICON OXIDES; SUBSTRATES; SURFACE ENERGY; THIN FILMS; TRAPS
- Descriptors DEC
- AZINES; CHALCOGENIDES; ELECTRICAL PROPERTIES; ENERGY; FILMS; FREE ENERGY; HETEROCYCLIC COMPOUNDS; MATERIALS; MICROSCOPY; MOBILITY; MOLYBDENUM COMPOUNDS; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYMERS; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; SPECTRA; SULFIDES; SULFUR COMPOUNDS; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- AID: 2100795