Temperature dependent rotation of the uniaxial easy axis of magnetization in granular SiO2–(Co/Fe/CoFe2)–Si(1 1 1) multilayers
- 1. Institute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21 Prague 8 (Czech Republic)
- 2. Institute of Inorganic Chemistry of the ASCR, v.v.i., 250 68 Husinec-Řež 1001 (Czech Republic)
Description
We have observed temperature dependent rotation of the uniaxial easy axis of magnetization and introduced the phenomenon of the superspin reorientation transition (SSRT) for the nanogranular thin films and multilayers. The effect is demonstrated on the nanogranular SiO2–M(x)–Si(1 1 1) multilayers, where M is the metal (Co, Fe or CoFe2) of the nominal thickness x = 3, 5 and 10 nm, respectively. The morphology and layer thickness have been examined using the transmission electron microscopy, X-ray reflectivity measurement and atomic force microscopy. Magnetic property measurements demonstrated that the orientation of the uniaxial in-plane easy axis of magnetization given by the film shape anisotropy was thickness independent at temperatures above 200 K. Below 50 K, the films shape anisotropy has been overcome and the uniaxial easy axis was rotated into different directions for each samples series, forming an angles from 40 up to 150° with respect to the film plane. Such effect of the low temperature magnetization rotation has been attributed to the specific arrangement of the nanoparticles in the individual layers and has been assigned to the SSRT phenomena.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.10.147Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.10.147;
- PII
- S0169-4332(13)02016-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 289
- Journal Page Range
- p. 257-265
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46005049
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; ATOMIC FORCE MICROSCOPY; COBALT; GRANULAR MATERIALS; INTERACTIONS; IRON; LAYERS; MAGNETIC PROPERTIES; MAGNETIZATION; NANOPARTICLES; NANOSTRUCTURES; REFLECTIVITY; SILICON; SILICON OXIDES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IONIZING RADIATIONS; MATERIALS; METALS; MICROSCOPY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PARTICLES; PHYSICAL PROPERTIES; RADIATIONS; SEMIMETALS; SILICON COMPOUNDS; SURFACE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.