Direct recovery of the electrical admittivities in 2D electrical tomography by using Calderon's method and two-terminal/electrode excitation strategies
Creators
- 1. Key Laboratory of Precision Opto-Mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing 100191 (China)
Description
Calderon's method was used to reconstruct electrical admittivity, i.e. conductivity as well as permittivity, for electrical tomography in this paper. It is a direct algorithm of the image reconstruction, as the value of the real and imaginary parts of the admittivity at any position can be obtained independently. A new way to construct the Dirichlet-to-Neumann map from the data collected through two-terminal/electrode excitation strategy was also introduced to calculate the scattering transform. The image reconstruction was implemented through numerical integration. Since the Gauss–Legendre quadrature was applied and can be predetermined, the image reconstruction process was fast and resulted in images of good quality. Both simulated and experimental results validated the feasibility and effectiveness of the proposed method in dual-modality electrical tomography. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/24/7/074007Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 24
- Journal Issue
- 7
- Journal Page Range
- [11 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46018515
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; COMPUTERIZED SIMULATION; DIRICHLET PROBLEM; ELECTRIC CONDUCTIVITY; ELECTRODES; EXCITATION; IMAGE PROCESSING; IMAGES; MEASURING METHODS; PERMITTIVITY; QUADRATURES; TOMOGRAPHY
- Descriptors DEC
- BOUNDARY-VALUE PROBLEMS; DIAGNOSTIC TECHNIQUES; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ENERGY-LEVEL TRANSITIONS; MATHEMATICAL LOGIC; PHYSICAL PROPERTIES; PROCESSING; SIMULATION