Published April 1981
| Version v1
Journal article
PIXE as an analytical tool--an external-beam system in helium and the role of sample preparation
Description
A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given. 9 refs
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-28
- Journal Issue
- 2
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1382-1385
- ISSN
- 0018-9499
Conference
- Title
- 6. conference on application of accelerators in research and industry.
- Dates
- Nov 1980.
- Place
- Denton, TX (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14745180
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AEROSOLS; CADMIUM SULFIDES; CORALS; HELIUM; PIXE ANALYSIS; SAMPLE PREPARATION; SEDIMENTS; SPECTRA; TARGET CHAMBERS; USES
- Descriptors DEC
- ACCELERATOR FACILITIES; ANIMALS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; CNIDARIA; COELENTERATA; COLLOIDS; DISPERSIONS; ELEMENTS; INORGANIC PHOSPHORS; INVERTEBRATES; NONDESTRUCTIVE ANALYSIS; NONMETALS; PHOSPHORS; RARE GASES; SOLS; SULFIDES; SULFUR COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- CONF-801111--.