Published January 1, 2005 | Version v1
Journal article

Complex ridgelets for the extraction of morphological features on engineering surfaces

  • 1. Centre for Precision Technologies, School of Computing and Engineering, University of Huddersfield, Huddersfield, HD1 3DH (United Kingdom)
  • 2. Taylor Hobson Ltd, 2 New Star Road, Leicester, LE4 9JQ (United Kingdom)

Description

In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/13/246/jpconf5_13_057.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
13
Journal Issue
1
Journal Page Range
p. 246-249
ISSN
1742-6596

Conference

Title
7. international symposium on measurement technology and intelligent instruments
Dates
6-8 Sep 2005
Place
Huddersfield (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36111586
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENGINEERING; LINERS; MEASURING METHODS; SINGULARITY; SURFACE PROPERTIES; TRANSFORMATIONS