Formation and dissociation of Zn nanoclusters in MgO
Description
Zinc nanoclusters were created in MgO by implantation of 1 x 1017 Zn ions cm-2 at an energy of 140 keV and subsequent thermal annealing. The defect evolution was investigated by means of optical absorption spectroscopy, Rutherford backscattering spectrometry and channeling, Doppler broadening positron beam analysis, and with cross-sectional transmission electron microscopy (XTEM). After annealing at 1150 K, an optical absorption band appears due to plasmon resonance. TEM investigations confirm that metallic Zn nanoclusters with sizes of 5-10 nm are formed at this temperature. The nanoclusters have the hcp Zn crystal structure and the c-axis is aligned with one of the cubic MgO axes, i.e. MgO(0 0 1) parallel Zn(0 0 0 1). The nanoclusters dissociate during annealing at 1550 K. At this temperature, the Zn is dissolved and diffuses into the MgO matrix
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2003.11.065;
- PII
- S0168583X0302175X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 216
- Journal Issue
- 2-3
- Journal Page Range
- p. 390-395
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- E-MRS 2003 Symposium E on ion beams for nanoscale surface modifications
- Dates
- 10-13 Jun 2003
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Mexico
- INIS RN
- 35059725
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ANNEALING; CHANNELING; CROSS SECTIONS; CRYSTAL STRUCTURE; DISSOCIATION; DOPPLER BROADENING; ION IMPLANTATION; KEV RANGE 100-1000; MAGNESIUM OXIDES; MATRIX MATERIALS; OPTICS; PLASMONS; POSITRON BEAMS; RUTHERFORD SCATTERING; SOLID CLUSTERS; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY; ZINC; ZINC IONS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BEAMS; CHALCOGENIDES; CHARGED PARTICLES; ELASTIC SCATTERING; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; IONS; KEV RANGE; LEPTON BEAMS; LINE BROADENING; MAGNESIUM COMPOUNDS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; QUASI PARTICLES; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.