Published 1972
| Version v1
Report
Restricted
Surface film thickness determination by reflectivity measurements
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.
Files
Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- RFP--1911
Conference
- Title
- Annual meeting of optical society of america.
- Dates
- 17 Oct 1972.
- Place
- San Francisco, California, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 4078805
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COLOR; FILMS; MEASURING METHODS; REFLECTION; SURFACES; THICKNESS; THICKNESS GAGES
- Descriptors DEC
- DIMENSIONS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES
Optional Information
- Secondary number(s)
- CONF-721067--2.