X-ray dark-field imaging and its application. Laue case analyzer

A system on X-ray dark-field imaging under development and its application is reported. That comprises an asymmetric monochromator and a Laue case analyzer that has a specified thickness for a given X-ray photon energy or wavelength and a sample locating inbetween these. This system uses Si 4,4,0 diffraction for both X-ray optics element in a parallel arrangement. In order to achieve the dark-field imaging condition the Si Laue analyzer should be 1.075 mm in thickness for the X-ray energy of 35 keV. Since this system is very simple one can expect a variety of applications including material science, biology, palaeontology and clinical medicine where a large view area with size of 100 mm x 100 mm is needed. (author)