Published December 1991
| Version v1
Journal article
Dependency of superconducting films critical parameters on their microstructure
- 1. Lebedev Physical Inst., Academy of Sciences of the USSR, Moscow (USSR)
- 2. Inst. for Microelectronics Tech., Academy of Sciences, Chernogolovka (USSR)
Description
The structure of Nb thin films was investigated by means of scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). Critical magnetic fields, critical currents of the films and angular dependencies of these parameters were measured. Both the perpendicular upper critical magnetic field and the volume pinning force proved to be increasing with the increase of the granularity. (orig.)
Additional details
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 185-189
- Journal Issue
- pt.3
- Series
- Phys., C Supercond.
- Journal Page Range
- 2031-2032
- ISSN
- 0921-4534
- CODEN
- PHYCE
Conference
- Title
- The science of HTSC.
- Acronym
- 3. international conference on materials and mechanisms of superconductivity high temperature superconductors (M2S-HTSC-3)
- Dates
- 22-26 Jul 1991.
- Place
- Kanazawa (Japan).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23042341
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; CRITICAL CURRENT; CRITICAL FIELD; FILMS; MAGNETIC FIELDS; MAGNETIC FLUX; MICROSTRUCTURE; NIOBIUM; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSITION TEMPERATURE; TUNNEL EFFECT
- Descriptors DEC
- CRYSTAL STRUCTURE; CURRENTS; DISTRIBUTION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS