Published August 2008
| Version v1
Journal article
Design and test of a laser-based optical-fiber Bragg-grating accelerometer for seismic applications
Creators
- 1. CNR-Istituto Nazionale di Ottica Applicata, Sezione di Napoli, Comprensorio 'A Olivetti', via Campi Flegrei 34, 80078 Pozzuoli (Italy)
- 2. Ansaldo STS, Napoli, via Nuova delle Brecce 260, Napoli (Italy)
- 3. Istituto Nazionale di Geofisica e Vulcanologia, Sezione di Napoli—Osservatorio Vesuviano, via Diocleziano, 328, 80124 Napoli (Italy)
- 4. Istituto Nazionale di Geofisica e Vulcanologia, via di Vigna Murata 605, 00143 Roma (Italy)
Description
We report on a proof-of-principle work aimed at the development of fast-response fiber-optic accelerometers for seismic monitoring. The system is based on a semiconductor diode-laser source that interrogates a newly devised two-dimensional inertial sensor suitable for measurement of horizontal ground accelerations. Plane acceleration components of the sensor's mass are detected by two fiber Bragg gratings anchored to its structure. Calibration and comparison with a commercial accelerometer are presented. A great potential, in terms of frequency response and sensitivity, is demonstrated in view of possible field applications in active seismic areas
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/19/8/085306Additional details
Identifiers
- DOI
- 10.1088/0957-0233/19/8/085306;
- PII
- S0957-0233(08)77166-2;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 19
- Journal Issue
- 8
- Journal Page Range
- [7 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44113625
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATION; ACCELEROMETERS; ANCHORS; BRAGG REFLECTION; CALIBRATION; COMPARATIVE EVALUATIONS; DESIGN; LASERS; OPTICAL FIBERS; SEMICONDUCTOR DIODES; SENSITIVITY; SENSORS; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- EVALUATION; FIBERS; MEASURING INSTRUMENTS; REFLECTION; SEMICONDUCTOR DEVICES