Swift Heavy Ion Beam Modified Behaviour of Pure and Doped TGS Crystals
Creators
- 1. Department of Pure and Applied Physics Guru Ghasidas University, Koni, Bilaspur-495009 India (India)
Description
Modifications due to swift heavy ion (SHI) beam irradiation on polar surfaces of pure and doped tri-glycine sulphate (TGS) crystals are investigated using dielectric, ferroelectric, optical and scanning force microcopy with varying ion beam fluence. The dielectric response becomes diffuse and the loss decreases, the optical band gap gets modified, the surface micro-relief's show pits and protrusions converting into regular hillocks of nano-dimensions. The results are interpreted considering that irradiation takes the crystal to a non-equilibrium state and generates thermal/charge flux leading to thermally generated internal field. The micro-relief is explained as a result of domain orientation; piezoelectric compression and stretching creating inhomogeneous force gradient at domain walls.
Additional details
Identifiers
- DOI
- 10.1063/1.3120056;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1099
- Journal Issue
- 1
- Journal Page Range
- p. 380-384
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 12. international conference on application of accelerators in research and industry
- Acronym
- CAARI 2008
- Dates
- 10-15 Aug 2008
- Place
- Fort Worth, TX (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036923
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTALS; DOMAIN STRUCTURE; DOPED MATERIALS; FERROELECTRIC MATERIALS; GLYCINE; HEAVY IONS; ION BEAMS; IRRADIATION; PHYSICAL RADIATION EFFECTS; PIEZOELECTRICITY; RELAXATION LOSSES; SULFATES; SURFACES
- Descriptors DEC
- AMINO ACIDS; BEAMS; CARBOXYLIC ACIDS; CHARGED PARTICLES; DIELECTRIC MATERIALS; ELECTRICITY; ENERGY LOSSES; IONS; LOSSES; MATERIALS; MICROSCOPY; ORGANIC ACIDS; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; RADIATION EFFECTS; SULFUR COMPOUNDS
Optional Information
- Notes
- (c) 2009 American Institute of Physics