Electron energy loss spectroscopy of excitons in two-dimensional-semiconductors as a function of temperature
- 1. Laboratoire de Physique des Solides, Université Paris-Sud, CNRS-UMR 8502, Orsay 91405 (France)
- 2. Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565 (Japan)
- 3. Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal 23955-6900 (Saudi Arabia)
Description
We have explored the benefits of performing monochromated Electron Energy Loss Spectroscopy (EELS) in samples at cryogenic temperatures. As an example, we have observed the excitonic absorption peaks in single layer Transition Metal Dichalcogenides. These peaks appear separated by small energies due to spin orbit coupling. We have been able to distinguish the split for MoS2 below 300 K and for MoSe2 below 220 K. However, the distinction between peaks is only clear at 150 K. We have measured the change in absorption threshold between 150 K and 770 K for MoS2 and MoSe2. We discuss the effect of carbon and ice contamination in EELS spectra. The increased spectral resolution available made possible with modern monochromators in electron microscopes will require the development of stable sample holders which reaches temperatures far below that of liquid nitrogen.
Additional details
Identifiers
- DOI
- 10.1063/1.4947058;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 108
- Journal Issue
- 16
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48036162
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRON MICROSCOPES; ENERGY-LOSS SPECTROSCOPY; L-S COUPLING; MOLYBDENUM SELENIDES; MOLYBDENUM SULFIDES; MONOCHROMATORS; SAMPLE HOLDERS; SILICON OXIDES; TEMPERATURE DEPENDENCE; TRANSITION ELEMENTS; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CHALCOGENIDES; COUPLING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; ELEMENTS; INTERMEDIATE COUPLING; METALS; MICROSCOPES; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SELENIDES; SELENIUM COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2016 Author(s)