Published December 2012 | Version v1
Journal article

Chicago exploration days

  • 1. Fritz-Haber-Institut der Max-Planck-Gesellschaft Faradayweg 4-6 D-1000 Berlin 33 (Dahlem) (Germany)

Description

Single heavy atoms supported on thin carbon film were first imaged by Crewe, Wall and Langmore with their dark-field STEM. This glimpse into a hitherto invisible world we owe undeniably to Crewe's vision and determination, and to his gift to electrify, engage and encourage talented students. Since this successful event happened during my sabbatical stay in Crewe's group, the editors of this memorial volume asked me to write an account of its early history, which I gladly composed mostly from memory. The circumstances that led to my collaboration with Albert Crew in Chicago are reviewed, and the main project that we jointly embarked on the Chicago 1 MeV STEM is described. It is shown that the project was nearing completion and would have likely been successful, had funding been continued. The paper concludes with a tribute to Albert I wrote many years ago. -- Highlights: ►► Reasons and motivations for Crewe's interest in electron microscopy are reviewed. ► Reasons and motivations for Crewe's interest in electron microscopy are reviewed. ► Early theoretical work on STEM imaging is summarized. The design of the Chicago 1 MeV Scanning Transmission Electron Microscope is described. ► Construction details are illustrated. Reasons for the project not reaching a successful conclusion are given. ► Tribute is paid to Albert Crewe.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2012.03.015

Additional details

Identifiers

DOI
10.1016/j.ultramic.2012.03.015;
PII
S0304-3991(12)00057-5;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
123
Journal Page Range
p. 13-21
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45028032
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMS; CARBON; CHICAGO; ELECTRIC POTENTIAL; MEV RANGE; REVIEWS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
DEVELOPED COUNTRIES; DOCUMENT TYPES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; FILMS; ILLINOIS; MICROSCOPY; NONMETALS; NORTH AMERICA; URBAN AREAS; USA

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.