Published April 1993 | Version v1
Journal article

RBS-PIXE analysis on thin films of high-Tc oxide superconductors

  • 1. National Research Inst. for Metals, Tsukuba (Japan)

Description

PIXE combined with RBS has been applied to analyze minor and major elements in thin films of oxide superconductors deposited onto MgO substrates. It is shown that minor elements such as Fe, Ni and Cr incorporated in the films can be clearly distinguished from those dissolved in the MgO substrates. The level of these minor elements differed depending on the sputtering geometry, and the effects of these impurities on the superconductivity are also discussed. (orig.)

Additional details

Additional titles

Augmented title (English)
Bi-Sr-Ca-Cu-O

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B
Journal Volume
75
Journal Issue
1-4
Journal Page Range
p. 388-391.
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. international conference on particle induced X-ray emission (PIXE) and its analytical applications.
Dates
20-24 Jul 1992.
Place
Tokyo (Japan).