Spherical ion chamber under pressure
Creators
- 1. Laboratory of Detectors and New Dosimetrical Methods, National Institute for Physics and Nuclear Engineering - Horia Hulubei, PO Box MG-6, RO - 76900 Bucharest - Magurele (Romania)
Description
The spherical ion chamber under pressure is designed for the secondary calibration of alpha, beta and gamma radioactive sources. Very low activity of such sources can be measured by placing them inside the ion chamber and using air or krypton and xenon gases up to 10 Atm. The ion chamber is made by two hemispherical metallic electrodes polarized with 100 - 500 V d.c. and a special inner collecting electrode having the radioactive source placed in a central position. The main insulation material is Teflon. The sphere diameter is 200 mm. The pressure control is made by an external proper instrument. The tightness of chamber is good enough: at 5 atm. pressure during 6 days the pressure loose is 0.15 bar. Measurements made for several experimental studies were performed using a complete computing chain: Keithley 617 Programmable Electrometer, DTK Computer (486 type), Test Point and IEEE-488 Interface. (authors)
Availability note (English)
Available from author(s) or from National Institute for Physics and Nuclear Engineering-Horia Hulubei, Str. Atomistilor No. 109, PO Box MG-6, RO-76900, Bucharest-Magurele (RO)Additional details
Publishing Information
- Imprint Title
- NIPNE-Scientific Report 1996
- Imprint Pagination
- 286 p.
- Journal Page Range
- p. 218
- Report number
- NIPNE-AR--1997
INIS
- Country of Publication
- Romania
- Country of Input or Organization
- Romania
- INIS RN
- 30048774
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature, Progress Report
- Descriptors DEI
- AIR; ALPHA SOURCES; BETA SOURCES; CALIBRATION; ELECTRODES; GAMMA SOURCES; KRYPTON; MEDIUM PRESSURE; PRESSURE CONTROL; PROGRESS REPORT; RADIATION DETECTORS; TEFLON; XENON
- Descriptors DEC
- CONTROL; DOCUMENT TYPES; ELEMENTS; FLUIDS; GASES; ION SOURCES; MATERIALS; MEASURING INSTRUMENTS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; PARTICLE SOURCES; PETROCHEMICALS; PETROLEUM PRODUCTS; PLASTICS; POLYETHYLENES; POLYMERS; POLYOLEFINS; RADIATION SOURCES; RARE GASES; SYNTHETIC MATERIALS
Optional Information
- Notes
- Short communication