Surface deformation studies of MnO2 film by double exposure digital holographic interferometry technique
Creators
- 1. Holography and Materials Research Laboratory, Department of Physics, Shivaji University, Kolhapur- 416004 (M.S.) India (India)
Description
In the present paper, the MnO2 films have been deposited on stainless steel support by potentiostatic mode of electrodeposition at different times. The x-ray diffraction, Fourier transform infrared spectroscopy along with Energy-dispersive x-ray spectroscopy analysis confirmed formation of amorphous MnO2 coating. The surface analysis by field emission scanning electron microscope indicated development of fractures with increasing film thickness. The in situ measurement of stress to the substrate and MnO2 film thickness during deposition is performed by non-destructive double exposure digital holographic interferometry (DEDHI) technique. It was observed that the stress to the substrate decreases with increasing MnO2 film thickness. This study opens application of DEDHI for non-destructive measurement using simple mathematical interpretation. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/aafab2Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 6
- Journal Issue
- 4
- Journal Page Range
- [8 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51103945
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRODEPOSITION; FILMS; FOURIER TRANSFORM SPECTROMETERS; HOLOGRAPHY; INTERFEROMETRY; MANGANESE OXIDES; OXIDATION; SCANNING ELECTRON MICROSCOPY; STAINLESS STEELS; THICKNESS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTROLYSIS; ELECTRON MICROSCOPY; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; LYSIS; MANGANESE COMPOUNDS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SPECTROMETERS; SPECTROSCOPY; STEELS; SURFACE COATING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS