Structural evolution, ferroelectric, and nanomechanical properties of Bi1-xSmxFeO3 films (x = 0.05–0.16) on glass substrates
- 1. Department of Applied Physics, Tunghai University, Taichung 407 (China)
- 2. Department of Electrical Engineering, Hsiuping University of Science and Technology, Taichun 412 (China)
- 3. Department of Physics, National Chung Cheng University, ChiaYi 621 (China)
- 4. Department of Physics, Fu Jen Catholic University, Taipei 24205 (China)
Description
This study reports influences of Sm doping on the crystal structure, nanomechanical and ferroelectric properties of Bi1-xSmxFeO3 (BSFO) thin films. BSFO films of perovskite phase were deposited on Pt/glass substrates by pulse laser deposition (PLD). The structural analysis shows that the BSFO transforms from rhombohedral structure into orthorhombic structure with the phase boundary near x = 0.16. The structure morphology of the thin films determined by using SEM and AFM exhibited that the grain size and surface roughness are reduced with increasing Sm content in BSFO. The hardness and Young's modulus are obtained in the range of 7.7–10.1 GPa and 154.6–167.5 GPa, respectively. Ferroelectric properties with remanent polarizations (2Pr) and coercive fields (Ec) occur respectively in the ranges of 41–150 μC/cm2 and 327–450 kV/cm for x = 0.05–0.14. The enhanced ferroelectric properties can be attributed to the smooth interface and fine microstructure with small grain sizes in range of 30–200 nm. A double ferroelectric hysteresis P-E loop with a different nanomechanical properties is observed in the composition of x = 0.16 and is associated with the appearance of orthorhombic phase. The leakage behavior with mechanisms and nanomechanical characterizations are also studied as functions of Sm content.
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2019.02.008;
- PII
- S0925838819304414;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 787
- Journal Page Range
- p. 397-406
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55047208
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; ENERGY BEAM DEPOSITION; FERROELECTRIC MATERIALS; GLASS; GRAIN SIZE; HARDNESS; LASER RADIATION; MORPHOLOGY; ORTHORHOMBIC LATTICES; PEROVSKITE; POLARIZATION; PULSED IRRADIATION; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; THIN FILMS; TRIGONAL LATTICES
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; DIELECTRIC MATERIALS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; IRRADIATION; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; MINERALS; OXIDE MINERALS; PEROVSKITES; RADIATIONS; SIZE; SURFACE COATING; SURFACE PROPERTIES; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.