Published 2007 | Version v1
Miscellaneous Metadata-only

Analysis of structural defects in monocrystal Bi+Sb alloys by X-ray topography

Creators

  • 1. Novgorodskij Gosudarstvennyj Univ. im. Yaroslava Mudrogo, Velikij Novgorod (Russian Federation)

Description

no abstract available

Part of:
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts

Additional details

Additional titles

Original title (Russian)
Анализ структурных дефектов в монокристаллических сплавах Би+Сб методами рентгеновской топографии

Publishing Information

Publisher
IK RAN
Imprint Place
Moscow (Russian Federation)
Imprint Title
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts
Imprint Pagination
650 p.
Journal Page Range
p. 439
Report number
INIS-RU--507

Conference

Title
6. National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation
Original Conference Title
VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007)
Acronym
RSNEh 2007
Dates
12-17 Nov 2007
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
39080060
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
ANTIMONY ALLOYS; BINARY ALLOY SYSTEMS; BISMUTH ALLOYS; CRYSTAL GROWTH; DISLOCATIONS; MONOCRYSTALS; POINT DEFECTS; X-RAY DIFFRACTION
Descriptors DEC
ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; LINE DEFECTS; SCATTERING

Optional Information

Notes
Imprint:VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007). Prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov. Tezisy dokladov