Published October 2004
| Version v1
Journal article
Measurements of the counting statistics on RAR-2497 and DEF x-ray film
- 1. Sandia National Laboratories, Albuquerque, New Mexico 87185-1196 (United States)
Description
X-ray film is commonly used to diagnose high temperature plasmas. Quantitative analysis of the recorded film exposure requires knowledge of the counting statistics inherent to each particular film type. To address this issue, RAR-2497 and DEF film were exposed on a Manson x-ray source for multiple fluence values and photon energies. The fluctuations in the measured intensity were found by determining the statistical distribution of the recorded photon intensity using Henke's calibration tables to relate the net film density to the incident intensity. The resulting measurements of the statistical fluctuations in photon intensity are presented for each film type
Additional details
Identifiers
- DOI
- 10.1063/1.1788865;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 10
- Journal Page Range
- p. 3687-3689
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36080053
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; ELECTRON TEMPERATURE; FLUCTUATIONS; HOT PLASMA; ION TEMPERATURE; PHOTONS; PLASMA DIAGNOSTICS; X-RAY SOURCES; X-RAY SPECTRA
- Descriptors DEC
- BOSONS; ELEMENTARY PARTICLES; MASSLESS PARTICLES; PLASMA; RADIATION SOURCES; SPECTRA; VARIATIONS
Optional Information
- Notes
- (c) 2004 American Institute of Physics