Published July 2009
| Version v1
Journal article
Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Creators
- 1. Department of Electronic Materials Engineering, Australian National University, Canberra, ACT 0200 (Australia)
- 2. SLS, Paul Scherrer Institut, PSI West, CH-5232 Villigen PSI (Switzerland)
- 3. Departamento de Fisica de la Tierra, Astronomia y Astrofisica I, Universidad Complutense de Madrid, E-28040 (Spain)
- 4. Chalmers University of Technology, SE-412 96 Goeteborg (Sweden)
- 5. MAX-lab, Lund University, P.O. Box 118, SE-22100 Lund (Sweden)
- 6. Department of Physics and Materials Science, Uppsala University, PO Box 530, SE-751 21 Uppsala (Sweden)
Description
Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2009.05.017Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2009.05.017;
- PII
- S0368-2048(09)00157-1;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 173
- Journal Issue
- 2-3
- Journal Page Range
- p. 103-107
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41048590
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- ELECTRONS; GERMANIUM; INELASTIC SCATTERING; RESONANCE; SOFT X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; IONIZING RADIATIONS; LEPTONS; METALS; RADIATIONS; SCATTERING; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.