Published July 2009 | Version v1
Journal article

Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

  • 1. Department of Electronic Materials Engineering, Australian National University, Canberra, ACT 0200 (Australia)
  • 2. SLS, Paul Scherrer Institut, PSI West, CH-5232 Villigen PSI (Switzerland)
  • 3. Departamento de Fisica de la Tierra, Astronomia y Astrofisica I, Universidad Complutense de Madrid, E-28040 (Spain)
  • 4. Chalmers University of Technology, SE-412 96 Goeteborg (Sweden)
  • 5. MAX-lab, Lund University, P.O. Box 118, SE-22100 Lund (Sweden)
  • 6. Department of Physics and Materials Science, Uppsala University, PO Box 530, SE-751 21 Uppsala (Sweden)

Description

Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2009.05.017

Additional details

Identifiers

DOI
10.1016/j.elspec.2009.05.017;
PII
S0368-2048(09)00157-1;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
173
Journal Issue
2-3
Journal Page Range
p. 103-107
ISSN
0368-2048
CODEN
JESRAW

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41048590
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Descriptors DEI
ELECTRONS; GERMANIUM; INELASTIC SCATTERING; RESONANCE; SOFT X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; IONIZING RADIATIONS; LEPTONS; METALS; RADIATIONS; SCATTERING; X RADIATION

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.