Published May 23, 1991
| Version v1
Journal article
Fluorescence lifetime studies of MeV erbium implanted silica glass
Creators
- 1. AT and T Bell Labs., Murray Hill, NJ (USA)
Description
MeV erbium ion implantation into various SiO2 glasses has been studied with the aim of incorporating the rare-earth dopant as an optically active ion in the silica network. The lifetime of the excited state ranges from 1.6 to 12.8 ms, depending on base material and implantation fluence. These results have positive implications for silica-based integrated optical technology. (Author)
Additional details
Publishing Information
- Journal Title
- Electronics Letters
- Journal Volume
- 27
- Journal Issue
- 11
- Series
- Electron. Lett.
- Journal Page Range
- 993-995
- ISSN
- 0013-5194
- CODEN
- ELLEA
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 22078350
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DOPED MATERIALS; ERBIUM ADDITIONS; ERBIUM IONS; EXCITED STATES; FIBER OPTICS; FLUORESCENCE; GLASS; ION IMPLANTATION; LIFETIME; MEV RANGE; OPTICAL ACTIVITY; OPTICAL FIBERS; OPTICAL SYSTEMS; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; EMISSION; ENERGY LEVELS; ENERGY RANGE; FIBERS; IONS; LUMINESCENCE; MATERIALS; OPTICAL PROPERTIES; OPTICS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; RARE EARTH ADDITIONS; SILICON COMPOUNDS