Ab Initio Investigation of Helium Bubble Formation from Trapped He+ Ions in Solid Hydrogen
Creators
- 1. State University of New York at Albany, Department of Physics (United States)
- 2. RIKEN - Institute of Physical and Chemical Research, Wako, Muon Science Laboratory (Japan)
Description
We are involved in a program aimed at a first-principles examination of the possibility of helium bubble formation in solid hydrogen. Our procedure is based on an extension of the Hartree-Fock cluster approach that we have been using for study of individual He+ ions in solid hydrogen. The preliminary results of our cluster investigations of a particular configuration of two He+ ions in neighboring tetrahedral interstitial positions are presented here. It has been found that the hydrogen molecules common to the two He+ ions lead to a substantial attractive force between the ions that almost overcomes their inherent repulsion, leading to a binding energy for this configuration only slightly less than the binding energy for two well separated trapped He+ ions. The analysis of our results have suggested future investigations of different pairs of trapping sites which appear to be more favorable for providing higher binding energies for the He+ pairs.
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 138
- Journal Issue
- 1-4
- Journal Page Range
- p. 431-434
- ISSN
- 0304-3843
- CODEN
- HYINDN
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43023479
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BINDING ENERGY; BUBBLES; COMPUTERIZED SIMULATION; HARTREE-FOCK METHOD; HELIUM; HELIUM IONS; HYDROGEN; INTERSTITIALS; MOLECULES; SOLIDS; TRAPPING
- Descriptors DEC
- APPROXIMATIONS; CALCULATION METHODS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY; FLUIDS; GASES; IONS; NONMETALS; POINT DEFECTS; RARE GASES; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2001 Kluwer Academic Publishers